Federal contract award

80GRC025CA009

ABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS

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Award details

Obligations, current value and potential value describe different measures; they are never added together.

FieldReported value
AgencyNational Aeronautics and Space Administration
OfficeNASA GLENN RESEARCH CENTER
NAICS541715 — Research and Development in the Physical, Engineering, and Life Sciences (except Nanotechnology and Biotechnology)
PSCAR11 — SPACE R&D SERVICES; SPACE FLIGHT, RESEARCH AND SUPPORTING ACTIVITIES; BASIC RESEARCH
Parent award / vehicleNot reported
Set-asideNO SET ASIDE USED.
Pricing typeFIRM FIXED PRICE
Obligations$278.8K
Current contract value$278.8K
Potential contract value / ceiling$278.8K
Start dateNov 19, 2024
Current end dateSep 1, 2026
Potential end dateSep 1, 2026
Latest award activityApr 21, 2026
Source loadedSep 19, 2026

Funding and modification history

Showing the latest 7 of 7 loaded transactions. Negative values are deobligations.

DateModificationObligation changeDescription
Apr 21, 2026P00006$0FABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Feb 3, 2026P00005$0FABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Dec 4, 2025P00004$0FABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Aug 11, 2025P00003$0REMOVAL OF CLAUSES/DRDS IAW [PCD 25-01, PCD 25-02] FABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Jun 11, 2025P00002$0REMOVAL OF CLAUSES/DRDS IAW [PCD 25-01, PCD 25-02] FABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Apr 7, 2025P00001$0REMOVAL OF CLAUSES/DRDS IAW [PCD 25-01, PCD 25-02] ABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS
Nov 19, 20240$278.8KABRICATION OF SMALL-FEATURE EXTREME ENVIRONMENT DURABLE 4H-SIC SILICON CARBIDE (SIC) JUNCTION FIELD EFFECT INTEGRATED CIRCUITS ON 100 MM DIAMETER SIC WAFERS

Research next steps

  1. Check the stated set-aside against the solicitation and current certifications.
  2. Review the award scope and buyer evidence before making a bid/no-bid decision.