Federal contract award
FA239626PB050
AFRL/RWTE HAS A REQUIREMENT TO PROCURE AND REPLACE THE LMIS2 ION SOURCE, FIB CONDENSER LENS ASSEMBLY, AND ASSOCIATED COMPONENTS FOR THE HITACHI NX9000 FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM).
Award details
Obligations, current value and potential value describe different measures; they are never added together.
| Field | Reported value |
|---|---|
| Agency | Department of Defense |
| Office | FA2396 USAF AFMC AFRL PZL AFRL PZLE |
| NAICS | 811210 — Electronic and Precision Equipment Repair and Maintenance |
| PSC | J066 — Maintenance, Repair and Rebuilding of Equipment: Instruments and Laboratory Equipment |
| Parent award / vehicle | Not reported |
| Set-aside | NO SET ASIDE USED. |
| Pricing type | FIRM FIXED PRICE |
| Obligations | $24.8K |
| Current contract value | $24.8K |
| Potential contract value / ceiling | $24.8K |
| Start date | Jun 15, 2026 |
| Current end date | Sep 30, 2026 |
| Potential end date | Sep 30, 2026 |
| Latest award activity | Jun 12, 2026 |
| Source loaded | Sep 26, 2026 |
Funding and modification history
Showing the latest 1 of 1 loaded transactions. Negative values are deobligations.
| Date | Modification | Obligation change | Description |
|---|---|---|---|
| Jun 12, 2026 | 0 | $24.8K | AFRL/RWTE HAS A REQUIREMENT TO PROCURE AND REPLACE THE LMIS2 ION SOURCE, FIB CONDENSER LENS ASSEMBLY, AND ASSOCIATED COMPONENTS FOR THE HITACHI NX9000 FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM). |
Research next steps
- Check the stated set-aside against the solicitation and current certifications.
- Review the award scope and buyer evidence before making a bid/no-bid decision.